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[IEEE Comput. Soc. Press European Design and Test Conference. ED & TC 97 - Paris, France (17-20 March 1997)] Proceedings European Design and Test Conference. ED & TC 97 - Design of partially parallel scan chain

✍ Scribed by Higami, Y.; Kinoshita, K.

Book ID: 120208125
Publisher: IEEE Comput. Soc. Press
Year: 1997
Tongue: English
Weight: 114 KB
Category: Article
ISBN-13: 9780818677861
DOI: 10.1109/EDTC.1997.582439

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