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[IEEE Comput. Soc. Press ETC 93 Third European Test Conference - Rotterdam, Netherlands (19-22 April 1993)] Proceedings ETC 93 Third European Test Conference - New methods for parallel pattern fast fault simulation for synchronous sequential circuits

โœ Scribed by Mojtahedi, M.; Geisselhardt, W.


Book ID
126753938
Publisher
IEEE Comput. Soc. Press
Year
1993
Weight
165 KB
Category
Article
ISBN-13
9780818633607

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