𝔖 Bobbio Scriptorium

✦ LIBER ✦

[IEEE Comput. Soc. Press ETC 93 Third European Test Conference - Rotterdam, Netherlands (19-22 April 1993)] Proceedings ETC 93 Third European Test Conference - On scan path design for stuck-open and delay fault detection

✍ Scribed by Leenstra, J.; Koch, M.; Schwederski, T.

Book ID: 126742423
Publisher: IEEE Comput. Soc. Press
Year: 1993
Weight: 1001 KB
Category: Article
ISBN-13: 9780818633607
DOI: 10.1109/ETC.1993.246553

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

[IEEE Comput. Soc. Press ETC 93 Third Eu

[IEEE Comput. Soc. Press ETC 93 Third European Test Conference - Rotterdam, Netherlands (19-22 April 1993)] Proceedings ETC 93 Third European Test Conference - Basic boundary-scan for in-circuit test

✍ Albee, A.J.; Ellis, M.; Robinson, G.D. 📂 Article 📅 1993 🏛 IEEE Comput. Soc. Press ⚖ 477 KB

[IEEE Comput. Soc. Press ETC 93 Third Eu

[IEEE Comput. Soc. Press ETC 93 Third European Test Conference - Rotterdam, Netherlands (19-22 April 1993)] Proceedings ETC 93 Third European Test Conference - Partial scan: what problem does it solve?

✍ Bennetts, R.G.; Beenker, F.P.M. 📂 Article 📅 1993 🏛 IEEE Comput. Soc. Press ⚖ 561 KB

[IEEE Comput. Soc. Press ETC 93 Third Eu

[IEEE Comput. Soc. Press ETC 93 Third European Test Conference - Rotterdam, Netherlands (19-22 April 1993)] Proceedings ETC 93 Third European Test Conference - A deductive method for simulating transistor stuck-open faults in CMOS circuits

✍ Yanbing Xu, ; Abd-El-Barr, M.; McCrosky, C. 📂 Article 📅 1993 🏛 IEEE Comput. Soc. Press ⚖ 630 KB

[IEEE Comput. Soc. Press ETC 93 Third Eu

[IEEE Comput. Soc. Press ETC 93 Third European Test Conference - Rotterdam, Netherlands (19-22 April 1993)] Proceedings ETC 93 Third European Test Conference - Current vs. logic testability of bridges in scan chains

✍ Rodriguez-Montanes, R.; Figueras, J.; Rubio, A. 📂 Article 📅 1993 🏛 IEEE Comput. Soc. Press ⚖ 294 KB

[IEEE Comput. Soc. Press ETC 93 Third Eu

[IEEE Comput. Soc. Press ETC 93 Third European Test Conference - Rotterdam, Netherlands (19-22 April 1993)] Proceedings ETC 93 Third European Test Conference - A model for functional test generation and testability analysis

✍ Gulbins, M.; Straube, B.; Elst, G. 📂 Article 📅 1993 🏛 IEEE Comput. Soc. Press ⚖ 205 KB

[IEEE Comput. Soc. Press ETC 93 Third Eu

[IEEE Comput. Soc. Press ETC 93 Third European Test Conference - Rotterdam, Netherlands (19-22 April 1993)] Proceedings ETC 93 Third European Test Conference - Experimental results on aliasing errors in circular BIST design

✍ Kothari, R.D.; Dong Sam Ha, 📂 Article 📅 1993 🏛 IEEE Comput. Soc. Press ⚖ 828 KB