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[IEEE Comput. Soc. Press ETC 93 Third European Test Conference - Rotterdam, Netherlands (19-22 April 1993)] Proceedings ETC 93 Third European Test Conference - Current vs. logic testability of bridges in scan chains

✍ Scribed by Rodriguez-Montanes, R.; Figueras, J.; Rubio, A.

Book ID: 126688347
Publisher: IEEE Comput. Soc. Press
Year: 1993
Weight: 294 KB
Category: Article
ISBN-13: 9780818633607
DOI: 10.1109/ETC.1993.246581

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