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[IEEE Comput. Soc. Press ETC 93 Third European Test Conference - Rotterdam, Netherlands (19-22 April 1993)] Proceedings ETC 93 Third European Test Conference - A deductive method for simulating transistor stuck-open faults in CMOS circuits

✍ Scribed by Yanbing Xu, ; Abd-El-Barr, M.; McCrosky, C.

Book ID: 126654469
Publisher: IEEE Comput. Soc. Press
Year: 1993
Weight: 630 KB
Category: Article
ISBN-13: 9780818633607
DOI: 10.1109/ETC.1993.246565

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