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[IEEE Comput. Soc. Press ETC 93 Third European Test Conference - Rotterdam, Netherlands (19-22 April 1993)] Proceedings ETC 93 Third European Test Conference - Fault coverage and yield predictions: do we need more than 100% coverage?

✍ Scribed by Huisman, L.M.

Book ID: 126735051
Publisher: IEEE Comput. Soc. Press
Year: 1993
Weight: 535 KB
Category: Article
ISBN-13: 9780818633607
DOI: 10.1109/ETC.1993.246519

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