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[IEEE Comput. Soc. Press 8th International Conference on VLSI Design - New Delhi, India (4-7 Jan. 1995)] Proceedings of the 8th International Conference on VLSI Design - Test generation for cyclic combinational circuits

✍ Scribed by Raghunathan, A.; Ashar, P.; Malik, S.

Book ID: 126675984
Publisher: IEEE Comput. Soc. Press
Year: 1995
Weight: 769 KB
Category: Article
ISBN-13: 9780818669057
DOI: 10.1109/ICVD.1995.512086

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