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[IEEE Comput. Soc. Press 8th International Conference on VLSI Design - New Delhi, India (4-7 Jan. 1995)] Proceedings of the 8th International Conference on VLSI Design - VLSI design of systematic odd-weight-column byte error detecting SEC-DED codes

โœ Scribed by Penzo, L.; Sciuto, D.; Silvano, C.


Book ID
118223719
Publisher
IEEE Comput. Soc. Press
Year
1995
Tongue
English
Weight
623 KB
Volume
0
Category
Article
ISBN-13
9780818669057

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