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[IEEE Comput. Soc. Press 8th International Conference on VLSI Design - New Delhi, India (4-7 Jan. 1995)] Proceedings of the 8th International Conference on VLSI Design - VLSI design of systematic odd-weight-column byte error detecting SEC-DED codes

✍ Scribed by Penzo, L.; Sciuto, D.; Silvano, C.

Book ID: 118223719
Publisher: IEEE Comput. Soc. Press
Year: 1995
Tongue: English
Weight: 623 KB
Volume: 0
Category: Article
ISBN-13: 9780818669057
DOI: 10.1109/icvd.1995.512096

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