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[IEEE Comput. Soc. Press 8th International Conference on VLSI Design - New Delhi, India (4-7 Jan. 1995)] Proceedings of the 8th International Conference on VLSI Design - An improved output compaction technique for built-in self-test in VLSI circuits

✍ Scribed by Das, S.R.; Ho, H.T.; Jone, W.-B.; Nayak, A.R.

Book ID: 120934676
Publisher: IEEE Comput. Soc. Press
Year: 1995
Tongue: English
Weight: 505 KB
Category: Article
ISBN-13: 9780818669057
DOI: 10.1109/ICVD.1995.512147

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