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[IEEE Comput. Soc. Press 1993 IEEE 2nd Asian Test Symposium (ATS) - Beijing, China (16-18 Nov. 1993)] Proceedings of 1993 IEEE 2nd Asian Test Symposium (ATS) - State encoding and functional decomposition for self-checking sequential circuit design

✍ Scribed by Pagey, S.; Sherlekar, S.D.; Venkatesh, G.

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