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[IEEE Comput. Soc. Press 1993 IEEE 2nd Asian Test Symposium (ATS) - Beijing, China (16-18 Nov. 1993)] Proceedings of 1993 IEEE 2nd Asian Test Symposium (ATS) - On the testability of cascaded Reed Muller circuits

✍ Scribed by Lee, G.; Hwang, M.; Irwin, M.J.; Owens, R.M.

Book ID: 126730440
Publisher: IEEE Comput. Soc. Press
Year: 1993
Weight: 604 KB
Category: Article
ISBN-13: 9780818639302
DOI: 10.1109/ATS.1993.398816

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