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[IEEE Comput. Soc Eighth Asian Test Symposium - Shanghai, China (16-18 Nov. 1999)] Proceedings Eighth Asian Test Symposium (ATS'99) - Practical application of automated fault diagnosis for stuck-at, bridging, and measurement condition dependent faults in fully scanned sequential circuits

✍ Scribed by Shimoda, R.; Yoshida, T.; Watari, M.; Toyota, Y.; Nishi, K.; Motohara, A.

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