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[IEEE Comput. Soc IEEE International High Level Design Validation and Test Workshop (HLDVT'02) - Cannes, France (27-29 Oct. 2002)] Seventh IEEE International High-Level Design Validation and Test Workshop, 2002. - A simple and effective compression scheme for test pins reduction

✍ Scribed by Flottes, M.-L.; Poirier, R.; Rouzeyre, B.

Book ID: 118055316
Publisher: IEEE Comput. Soc
Year: 2002
Weight: 289 KB
Volume: 0
Category: Article
ISBN-13: 9780780376557
DOI: 10.1109/hldvt.2002.1224447

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