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[IEEE Comput. Soc Eighth IEEE International High-Level Design Validation and Test Workshop - San Francisco, CA, USA (12-14 Nov. 2003)] Eighth IEEE International High-Level Design Validation and Test Workshop - FPgen - a test generation framework for datapath floating-point verification

✍ Scribed by Aharoni, M.; Asaf, S.; Fournier, L.; Koifman, A.; Nagel, R.

Book ID: 120017866
Publisher: IEEE Comput. Soc
Year: 2003
Weight: 413 KB
Category: Article
ISBN-13: 9780780382367
DOI: 10.1109/HLDVT.2003.1252469

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