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[IEEE 2012 IEEE International High Level Design Validation and Test Workshop (HLDVT) - Huntington Beach, CA, USA (2012.11.9-2012.11.10)] 2012 IEEE International High Level Design Validation and Test Workshop (HLDVT) - A functional test generation technique for RTL datapaths

✍ Scribed by Alizadeh, Bijan; Fujita, Masahiro

Book ID: 120160200
Publisher: IEEE
Year: 2012
Weight: 544 KB
Category: Article
ISBN: 1467328987
DOI: 10.1109/HLDVT.2012.6418244

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