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[IEEE Comput. Soc 5th International Symposium on Quality Electronic Design - San Jose, CA, USA (22-24 March 2004)] SCS 2003. International Symposium on Signals, Circuits and Systems. Proceedings (Cat. No.03EX720) - Leakage control techniques for designing robust, low power wide-OR domino logic for sub-130nm CMOS technologies

✍ Scribed by Chatterjee, B.; Sachdev, M.; Krishnamurthy, R.

Book ID: 121691781
Publisher: IEEE Comput. Soc
Year: 2004
Tongue: English
Weight: 286 KB
Category: Article
ISBN-13: 9780769520933
DOI: 10.1109/isqed.2004.1283709

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