𝔖 Bobbio Scriptorium

✦ LIBER ✦

[IEEE Comput. Soc 5th International Symposium on Quality Electronic Design - San Jose, CA, USA (22-24 March 2004)] SCS 2003. International Symposium on Signals, Circuits and Systems. Proceedings (Cat. No.03EX720) - A versatile high speed bit error rate testing scheme

✍ Scribed by Yongquan Fan, ; Zeljko, Z.; Man Wah Chiang,

Book ID: 120557722
Publisher: IEEE Comput. Soc
Year: 2004
Tongue: English
Weight: 308 KB
Category: Article
ISBN-13: 9780769520933
DOI: 10.1109/ISQED.2004.1283706

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

[IEEE Comput. Soc 5th International Symp

[IEEE Comput. Soc 5th International Symposium on Quality Electronic Design - San Jose, CA, USA (22-24 March 2004)] International Symposium on Signals, Circuits and Systems. Proceedings, SCS 2003. (Cat. No.03EX720) - Design for manufacturing? design for yield!!!

✍ Levitt, M. 📂 Article 📅 2004 🏛 IEEE Comput. Soc ⚖ 379 KB

[IEEE Comput. Soc 5th International Symp

[IEEE Comput. Soc 5th International Symposium on Quality Electronic Design - San Jose, CA, USA (22-24 March 2004)] SCS 2003. International Symposium on Signals, Circuits and Systems. Proceedings (Cat. No.03EX720) - FinFET SRAM - device and circuit design considerations

✍ Ananthan, H.; Bansal, A.; Roy, K. 📂 Article 📅 2004 🏛 IEEE Comput. Soc 🌐 English ⚖ 371 KB

[IEEE Comput. Soc 5th International Symp

[IEEE Comput. Soc 5th International Symposium on Quality Electronic Design - San Jose, CA, USA (22-24 March 2004)] SCS 2003. International Symposium on Signals, Circuits and Systems. Proceedings (Cat. No.03EX720) - Stacked FSMD: a power efficient micro-architecture for high level synthesis

✍ Jasrotia, K.; Zhu, J. 📂 Article 📅 2004 🏛 IEEE Comput. Soc ⚖ 306 KB

[IEEE Comput. Soc 5th International Symp

[IEEE Comput. Soc 5th International Symposium on Quality Electronic Design - San Jose, CA, USA (22-24 March 2004)] SCS 2003. International Symposium on Signals, Circuits and Systems. Proceedings (Cat. No.03EX720) - The effect of threshold voltages on the soft error rate [memory and logic circuits]

✍ Degalahal, V.; Ramanarayanan, R.; Vijaykrishnan, N.; Xie, Y.; Irwin, M.J. 📂 Article 📅 2004 🏛 IEEE Comput. Soc 🌐 English ⚖ 303 KB

[IEEE Comput. Soc 5th International Symp

[IEEE Comput. Soc 5th International Symposium on Quality Electronic Design - San Jose, CA, USA (22-24 March 2004)] SCS 2003. International Symposium on Signals, Circuits and Systems. Proceedings (Cat. No.03EX720) - An adaptive path delay fault diagnosis methodology [logic IC testing]

✍ Padmanaban, S.; Tragoudas, S. 📂 Article 📅 2004 🏛 IEEE Comput. Soc 🌐 English ⚖ 225 KB

[IEEE Comput. Soc 5th International Symp

[IEEE Comput. Soc 5th International Symposium on Quality Electronic Design - San Jose, CA, USA (22-24 March 2004)] International Symposium on Signals, Circuits and Systems. Proceedings, SCS 2003. (Cat. No.03EX720) - Performance limitations of devices and interconnects and possible alternatives for nanoelectronics

✍ Saraswat, K. 📂 Article 📅 2004 🏛 IEEE Comput. Soc ⚖ 393 KB