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[IEEE Comput. Soc 2002 Design, Automation and Test in Europe Conference and Exhibition - Paris, France (4-8 March 2002)] Proceedings 2002 Design, Automation and Test in Europe Conference and Exhibition - A new ATPG algorithm to limit test set size and achieve multiple detections of all faults

✍ Scribed by Sooryong Lee, ; Cobb, B.; Dworak, J.; Grimaila, M.R.; Mercer, M.R.

Book ID: 118186302
Publisher: IEEE Comput. Soc
Year: 2002
Weight: 330 KB
Volume: 0
Category: Article
ISBN-13: 9780769514710
DOI: 10.1109/date.2002.998255

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