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[IEEE Comput. Soc 2002 Design, Automation and Test in Europe Conference and Exhibition - Paris, France (4-8 March 2002)] Proceedings 2002 Design, Automation and Test in Europe Conference and Exhibition - Top-down system level design methodology using SpecC, VCC and SystemC

✍ Scribed by Lukai Cai, ; Kritzinger, P.; Olivares, M.; Gajski, D.

Book ID: 111966720
Publisher: IEEE Comput. Soc
Year: 2002
Weight: 204 KB
Volume: 0
Category: Article
ISBN-13: 9780769514710
DOI: 10.1109/date.2002.998495

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