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[IEEE Comput. Soc 2002 Design, Automation and Test in Europe Conference and Exhibition - Paris, France (4-8 March 2002)] Proceedings 2002 Design, Automation and Test in Europe Conference and Exhibition - Reducing test application time through test data mutation encoding

✍ Scribed by Reda, S.; Orailoglu, A.

Book ID: 125512909
Publisher: IEEE Comput. Soc
Year: 2002
Weight: 293 KB
Category: Article
ISBN-13: 9780769514710
DOI: 10.1109/DATE.2002.998303

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