𝔖 Bobbio Scriptorium

✦ LIBER ✦

[IEEE Comput. Soc 1998 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems - Austin, TX, USA (2-4 Nov. 1998)] Proceedings 1998 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (Cat. No.98EX223) - Diagnosis of scan chain failures

✍ Scribed by Yuejian Wu,

Book ID: 126730489
Publisher: IEEE Comput. Soc
Year: 1998
Weight: 25 KB
Category: Article
ISBN-13: 9780818688324
DOI: 10.1109/DFTVS.1998.732169

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

[IEEE Comput. Soc 1998 IEEE Internationa

[IEEE Comput. Soc 1998 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems - Austin, TX, USA (2-4 Nov. 1998)] Proceedings 1998 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (Cat. No.98EX223) - FPGA design for decimeter scale integration (DMSI)

✍ Chapman, G.H. 📂 Article 📅 1998 🏛 IEEE Comput. Soc ⚖ 43 KB

[IEEE Comput. Soc 1998 IEEE Internationa

[IEEE Comput. Soc 1998 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems - Austin, TX, USA (2-4 Nov. 1998)] Proceedings 1998 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (Cat. No.98EX223) - Error-correcting Goldschmidt dividers using time shared TMR

✍ Gallagher, W.L.; Seartzlander, E.E. 📂 Article 📅 1998 🏛 IEEE Comput. Soc ⚖ 177 KB

[IEEE Comput. Soc 1998 IEEE Internationa

[IEEE Comput. Soc 1998 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems - Austin, TX, USA (2-4 Nov. 1998)] Proceedings 1998 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (Cat. No.98EX223) - Fault-tolerant voting mechanism and recovery scheme for TMR FPGA-based systems

✍ D'Angelo, S.; Metra, C.; Pastore, S.; Pogutz, A.; Sechi, G.R. 📂 Article 📅 1998 🏛 IEEE Comput. Soc ⚖ 53 KB

[IEEE Comput. Soc 1998 IEEE Internationa

[IEEE Comput. Soc 1998 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems - Austin, TX, USA (2-4 Nov. 1998)] Proceedings 1998 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (Cat. No.98EX223) - A system for evaluating on-line testability at the RT-level

✍ Chiusano, S.; Corno, F.; Reorda, M.S.; Viettie, R. 📂 Article 📅 1998 🏛 IEEE Comput. Soc ⚖ 66 KB

[IEEE Comput. Soc 1998 IEEE Internationa

[IEEE Comput. Soc 1998 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems - Austin, TX, USA (2-4 Nov. 1998)] Proceedings 1998 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (Cat. No.98EX223) - A comparison of efficient dot throwing and shape shifting extra material critical area estimation

✍ Allan, G.A. 📂 Article 📅 1998 🏛 IEEE Comput. Soc ⚖ 100 KB

[IEEE Comput. Soc. Press Proceedings. 19

[IEEE Comput. Soc. Press Proceedings. 1996 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems - Boston, MA, USA (6-8 Nov. 1996)] Proceedings. 1996 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems - Comprehensive modeling of VLSI test

✍ Ziaja, T.; Swartzlander, E. 📂 Article 📅 1996 🏛 IEEE Comput. Soc. Press ⚖ 346 KB