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[IEEE Comput. Soc 1998 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems - Austin, TX, USA (2-4 Nov. 1998)] Proceedings 1998 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (Cat. No.98EX223) - A comparison of efficient dot throwing and shape shifting extra material critical area estimation

✍ Scribed by Allan, G.A.

Book ID: 126699193
Publisher: IEEE Comput. Soc
Year: 1998
Weight: 100 KB
Category: Article
ISBN-13: 9780818688324
DOI: 10.1109/DFTVS.1998.732150

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