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[IEEE Annual Symposium Reliability and Maintainability, 2004 - RAMS - Los Angeles, CA, USA (Jan. 26-29, 2004)] Annual Symposium Reliability and Maintainability, 2004 - RAMS - Reliability prediction based on degradation modeling for systems with multiple degradation measures

✍ Scribed by Peng Wang, ; Coit, D.W.

Book ID: 120637248
Publisher: IEEE
Year: 2004
Weight: 376 KB
Category: Article
ISBN-13: 9780780382152
DOI: 10.1109/RAMS.2004.1285465

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