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[IEEE Annual Symposium Reliability and Maintainability, 2004 - RAMS - Los Angeles, CA, USA (Jan. 26-29, 2004)] Annual Symposium Reliability and Maintainability, 2004 - RAMS - An accelerated life testing model involving performance degradation

✍ Scribed by Wenbiao Zhao, ; Elsayed, E.A.

Book ID: 121249484
Publisher: IEEE
Year: 2004
Weight: 581 KB
Category: Article
ISBN-13: 9780780382152
DOI: 10.1109/RAMS.2004.1285469

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