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[IEEE Annual Symposium Reliability and Maintainability, 2004 - RAMS - Los Angeles, CA, USA (Jan. 26-29, 2004)] Annual Symposium Reliability and Maintainability, 2004 - RAMS - Planning of step-stress accelerated degradation test

✍ Scribed by Tang, L.C.; Yang, G.Y.; Xie, M.

Book ID: 121737112
Publisher: IEEE
Year: 2004
Weight: 345 KB
Category: Article
ISBN-13: 9780780382152
DOI: 10.1109/RAMS.2004.1285462

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