๐”– Bobbio Scriptorium
โœฆ   LIBER   โœฆ

[IEEE 8th International Symposium on Quality Electronic Design (ISQED'07) - San Jose, CA, USA (2007.03.26-2007.03.28)] 8th International Symposium on Quality Electronic Design (ISQED'07) - A TMR Scheme for SEU Mitigation in Scan Flip-Flops

โœ Scribed by Oliveira, Roystein; Jagirdar, Aditya; Chakraborty, Tapan J.


Book ID
120167421
Publisher
IEEE
Year
2007
Tongue
English
Weight
534 KB
Category
Article
ISBN-13
9780769527956

No coin nor oath required. For personal study only.


๐Ÿ“œ SIMILAR VOLUMES