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[IEEE 8th International Symposium on Quality Electronic Design (ISQED'07) - San Jose, CA, USA (2007.03.26-2007.03.28)] 8th International Symposium on Quality Electronic Design (ISQED'07) - Combating NBTI Degradation via Gate Sizing

✍ Scribed by Yang, Xiangning; Saluja, Kewal

Book ID: 121327836
Publisher: IEEE
Year: 2007
Tongue: English
Weight: 209 KB
Category: Article
ISBN-13: 9780769527956
DOI: 10.1109/ISQED.2007.48

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