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[IEEE 8th International Symposium on Quality Electronic Design (ISQED'07) - San Jose, CA, USA (2007.03.26-2007.03.28)] 8th International Symposium on Quality Electronic Design (ISQED'07) - Variation Impact on SER of Combinational Circuits

✍ Scribed by Ramakrishnan, K.; Rajaraman, R.; Suresh, S.; Vijaykrishnan, N.; Xie, Y.; Irwin, M.J.

Book ID: 121323778
Publisher: IEEE
Year: 2007
Tongue: English
Weight: 276 KB
Category: Article
ISBN-13: 9780769527956
DOI: 10.1109/ISQED.2007.168

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