[IEEE 7th International Symposium on Quality Electronic Design (ISQED'06) - San Jose, CA, USA (27-29 March 2006)] 7th International Symposium on Quality Electronic Design (ISQED'06) - New Generation of Predictive Technology Model for Sub-45nm Design Exploration

[IEEE 7th International Symposium on Qua

✍ Link, G.M.; Vijaykrishnan, N. 📂 Article 📅 2006 🏛 IEEE 🌐 English ⚖ 384 KB

[IEEE 7th International Symposium on Qua

✍ Zhuo Feng, ; Peng Li, ; Jiang Hu, 📂 Article 📅 2006 🏛 IEEE 🌐 English ⚖ 440 KB

[IEEE 7th International Symposium on Qua

✍ Agarwal, K.; Nowka, K.; Deogun, H.; Sylvester, D. 📂 Article 📅 2006 🏛 IEEE 🌐 English ⚖ 219 KB

[IEEE 7th International Symposium on Qua

✍ Bickford, J.; Hibbeler, J.; Buhler, M.; Koehl, J.; Muller, D.; Peyer, S.; Schult 📂 Article 📅 2006 🏛 IEEE ⚖ 250 KB

[IEEE 7th International Symposium on Qua

✍ Tirumala, S.; Mahotin, Y.; Lin, X.; Moroz, V.; Smith, L.; Krishnamurthy, S.; Bom 📂 Article 📅 2006 🏛 IEEE 🌐 English ⚖ 251 KB

[IEEE 7th International Symposium on Qua

✍ Hung, W.-L.; Link, G.M.; Xie, Y.; Vijaykrishnan, N.; Irwin, M.J. 📂 Article 📅 2006 🏛 IEEE 🌐 English ⚖ 283 KB