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[IEEE 7th International Symposium on Quality Electronic Design (ISQED'06) - San Jose, CA, USA (27-29 March 2006)] 7th International Symposium on Quality Electronic Design (ISQED'06) - Yield Improvement by Local Wiring Redundancy

✍ Scribed by Bickford, J.; Hibbeler, J.; Buhler, M.; Koehl, J.; Muller, D.; Peyer, S.; Schulte, C.

Book ID: 126676783
Publisher: IEEE
Year: 2006
Weight: 250 KB
Category: Article
ISBN-13: 9780769525235
DOI: 10.1109/ISQED.2006.148

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