[IEEE 58th ARFTG Conference Digest - San Diego, CA, USA (2001.11.29-2001.11.30)] 58th ARFTG Conference Digest - A complete measurement Test-Set for non-linear device characterization

✍ Scribed by Ferrero, Andrea; Teppati, Valeria

• Book ID: 126716991
• Publisher: IEEE
• Year: 2001
• Tongue: English
• Weight: 83 KB
• Category: Article
• ISBN-13: 9780780356863
• DOI: 10.1109/ARFTG.2001.327494