[IEEE 2012 80th ARFTG Microwave Measurement Conference - San Diego, CA, USA (2012.11.29-2012.11.30)] 80th ARFTG Microwave Measurement Conference - A procedure for measurement of s-parameters and eye-diagram of backplane using two-port VNA

✍ Scribed by Hoffmann, Karel; Randus, Martin

• Book ID: 121302447
• Publisher: IEEE
• Year: 2012
• Weight: 938 KB
• Category: Article
• ISBN: 1467348201
• DOI: 10.1109/ARFTG.2012.6422421