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[IEEE 4th International Conference on Solid-State and IC Technology - Beijing, China (24-28 Oct. 1995)] Proceedings of 4th International Conference on Solid-State and IC Technology - Study of the thermal annealing characteristic on SI-GaAs wafers

✍ Scribed by Guangping Li, ; Qiongna Ru, ; Jing Li, ; Xiukun He, ; Shenjun Nin, ; Xiaobing Guo,

Book ID: 120090400
Publisher: IEEE
Year: 1995
Weight: 214 KB
Category: Article
DOI: 10.1109/ICSICT.1995.500176

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