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[IEEE 46th International Symposium on Reliability and Maintainability - Product Quality and Integrity - Los Angeles, CA, USA (24-27 Jan. 2000)] Annual Reliability and Maintainability Symposium. 2000 Proceedings. International Symposium on Product Quality and Integrity (Cat. No.00CH37055) - Designed fatigue experiments to improve the reliability of liquid crystal displays

✍ Scribed by Scibilia, B.; Kobi, A.; Chassagnon, R.; Barreau, A.

Book ID: 126749133
Publisher: IEEE
Year: 2000
Weight: 520 KB
Category: Article
ISBN-13: 9780780358485
DOI: 10.1109/RAMS.2000.816313

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