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[IEEE 46th International Symposium on Reliability and Maintainability - Product Quality and Integrity - Los Angeles, CA, USA (24-27 Jan. 2000)] Annual Reliability and Maintainability Symposium. 2000 Proceedings. International Symposium on Product Quality and Integrity (Cat. No.00CH37055) - A review of plastic-encapsulated-microcircuit reliability-prediction models

✍ Scribed by Yin-Liong Mok, ; Lin-Mei Ten,

Book ID: 126648898
Publisher: IEEE
Year: 2000
Weight: 543 KB
Category: Article
ISBN-13: 9780780358485
DOI: 10.1109/RAMS.2000.816307

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