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[IEEE 46th International Symposium on Reliability and Maintainability - Product Quality and Integrity - Los Angeles, CA, USA (24-27 Jan. 2000)] Annual Reliability and Maintainability Symposium. 2000 Proceedings. International Symposium on Product Quality and Integrity (Cat. No.00CH37055) - Reliability assessment from degradation data

✍ Scribed by Crk, V.

Book ID: 121006795
Publisher: IEEE
Year: 2000
Weight: 531 KB
Category: Article
ISBN-13: 9780780358485
DOI: 10.1109/RAMS.2000.816300

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