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[IEEE 40th Conference on Electronic Components and Technology - Las Vegas, NV, USA (20-23 May 1990)] 40th Conference Proceedings on Electronic Components and Technology - Reliability study of gallium arsenide transistors

✍ Scribed by Maurer, R.H.; Chao, K.; Nhan, E.; Benson, R.C.; Bargeron, C.B.

Book ID: 111910156
Publisher: IEEE
Year: 1990
Weight: 525 KB
Volume: 0
Category: Article
DOI: 10.1109/ectc.1990.122261

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