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[IEEE 32nd European Solid-State Device Research Conference - Firenze, Italy (2002.9.24-2002.9.26)] 32nd European Solid-State Device Research Conference - A Method for Extraction of Power Dissipating Sources from Interferometric Thermal Mapping Measurements

✍ Scribed by Pogany, D.; Litzenberger, M.; Bychikhin, S.; Gornik, E.; Groos, G.; Stecher, M.

No coin nor oath required. For personal study only.

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