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[IEEE 28th International Spring Seminar on Electronics Technology: Meeting the Challenges of Electronics Technology Progress, 2005. - Wiener Neustadt, Austria (May 19-20, 2005)] 28th International Spring Seminar on Electronics Technology: Meeting the Challenges of Electronics Technology Progress, 2005. - A novel approach to electronic nose-head design, using a copper thin film electrode patterning technique

✍ Scribed by Arshak, K.; Cunniffe, C.; Moore, E.; Cavanagh, L.; Harris, J.

Book ID: 121489861
Publisher: IEEE
Year: 2005
Weight: 838 KB
Category: Article
ISBN-13: 9780780393257
DOI: 10.1109/ISSE.2005.1491024

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