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[IEEE 28th International Spring Seminar on Electronics Technology: Meeting the Challenges of Electronics Technology Progress, 2005. - Wiener Neustadt, Austria (May 19-20, 2005)] 28th International Spring Seminar on Electronics Technology: Meeting the Challenges of Electronics Technology Progress, 2005. - Analysis of a new magneto-optic angular displacement sensor using jones matrix approach

โœ Scribed by Melikhov, Y.; Lee, S.J.; Song, S.H.; Hauser, H.; Jiles, D.C.

Book ID
118117755
Publisher
IEEE
Year
2005
Weight
386 KB
Volume
0
Category
Article
ISBN-13
9780780393257

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[IEEE 28th International Spring Seminar
[IEEE 28th International Spring Seminar on Electronics Technology: Meeting the Challenges of Electronics Technology Progress, 2005. - Wiener Neustadt, Austria (May 19-20, 2005)] 28th International Spring Seminar on Electronics Technology: Meeting the Challenges of Electronics Technology Progress, 2005. - Error reducing techniques for the scattering parameter characterization of differential networks using a two-port network analyzer
โœ Ken Vaz, ; Ka Mun Ho, ; Caggiano, M. ๐Ÿ“‚ Article ๐Ÿ“… 2005 ๐Ÿ› IEEE โš– 582 KB