[IEEE 28th International Spring Seminar on Electronics Technology: Meeting the Challenges of Electronics Technology Progress, 2005. - Wiener Neustadt, Austria (May 19-20, 2005)] 28th International Spring Seminar on Electronics Technology: Meeting the Challenges of Electronics Technology Progress, 2005. - Error reducing techniques for the scattering parameter characterization of differential networks using a two-port network analyzer

✍ Scribed by Ken Vaz, ; Ka Mun Ho, ; Caggiano, M.

• Book ID: 115489266
• Publisher: IEEE
• Year: 2005
• Weight: 582 KB
• Volume: 0
• Category: Article
• ISBN-13: 9780780393257
• DOI: 10.1109/isse.2005.1491052