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[IEEE 2014 IEEE Intersociety Conference on Thermal and Thermomechanical Phenomena in Electronic Systems (ITherm) - Orlando, FL, USA (2014.5.27-2014.5.30)] Fourteenth Intersociety Conference on Thermal and Thermomechanical Phenomena in Electronic Systems (ITherm) - SSL and LED life prediction and assessment of CCT shift

✍ Scribed by Lall, Pradeep; Sakalaukus, Peter; Wei, Junchao; Davis, Lynn

Book ID: 126713871
Publisher: IEEE
Year: 2014
Weight: 879 KB
Category: Article
ISBN: 1479952672
DOI: 10.1109/ITHERM.2014.6892413

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