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[IEEE 2014 IEEE International Reliability Physics Symposium (IRPS) - Waikoloa, HI, USA (2014.6.1-2014.6.5)] 2014 IEEE International Reliability Physics Symposium - Activation of electrically silent defects in the high-k gate stacks

✍ Scribed by Veksler, D.; Bersuker, G.; Watkins, M. B.; Shluger, A.

No coin nor oath required. For personal study only.

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