𝔖 Bobbio Scriptorium

✦ LIBER ✦

[IEEE 2014 IEEE International Reliability Physics Symposium (IRPS) - Waikoloa, HI, USA (2014.6.1-2014.6.5)] 2014 IEEE International Reliability Physics Symposium - Stress migration in a copper - Aluminum hybrid technology

✍ Scribed by Christiansen, Cathryn; Chapple-Sokol, Jonathan; Coster, Michael; Hunt, Douglas; Lee, Tom C.; Murphy, William; Gambino, Jeffrey; Cooney, Edward; Kemerer, Timothy; Rassel, Richard; Stamper, Tony; U'Ren, Gregory; Lariviere, Stephane; Brandon, Stephane

Book ID: 126653254
Publisher: IEEE
Year: 2014
Weight: 698 KB
Category: Article
ISBN: 1479933171
DOI: 10.1109/IRPS.2014.6860580

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

[IEEE 2014 IEEE International Reliabilit

[IEEE 2014 IEEE International Reliability Physics Symposium (IRPS) - Waikoloa, HI, USA (2014.6.1-2014.6.5)] 2014 IEEE International Reliability Physics Symposium - Simulation-based reliability evaluation for analog applications

✍ Weber, Eduard; Echtle, Klaus 📂 Article 📅 2014 🏛 IEEE ⚖ 365 KB

[IEEE 2014 IEEE International Reliabilit

[IEEE 2014 IEEE International Reliability Physics Symposium (IRPS) - Waikoloa, HI, USA (2014.6.1-2014.6.5)] 2014 IEEE International Reliability Physics Symposium - A unified perspective of RTN and BTI

✍ Grasser, T.; Rott, K.; Reisinger, H.; Waltl, M.; Franco, J.; Kaczer, B. 📂 Article 📅 2014 🏛 IEEE ⚖ 423 KB

[IEEE 2014 IEEE International Reliabilit

[IEEE 2014 IEEE International Reliability Physics Symposium (IRPS) - Waikoloa, HI, USA (2014.6.1-2014.6.5)] 2014 IEEE International Reliability Physics Symposium - Impact of VLSI scaling on die qualification

✍ Haggag, Amr; Phillips, Michael; Lee, J.K. Jerry 📂 Article 📅 2014 🏛 IEEE ⚖ 739 KB

[IEEE 2014 IEEE International Reliabilit

[IEEE 2014 IEEE International Reliability Physics Symposium (IRPS) - Waikoloa, HI, USA (2014.6.1-2014.6.5)] 2014 IEEE International Reliability Physics Symposium - Variability challenges to electromigration (EM) lifetime projections

✍ Li, Baozhen; Christiansen, Cathryn; Filippi, Ronald 📂 Article 📅 2014 🏛 IEEE ⚖ 291 KB

[IEEE 2014 IEEE International Reliabilit

[IEEE 2014 IEEE International Reliability Physics Symposium (IRPS) - Waikoloa, HI, USA (2014.6.1-2014.6.5)] 2014 IEEE International Reliability Physics Symposium - Fundamentals and future applications of Laser Voltage Probing

✍ Kindereit, Ulrike 📂 Article 📅 2014 🏛 IEEE ⚖ 553 KB

[IEEE 2014 IEEE International Reliabilit

[IEEE 2014 IEEE International Reliability Physics Symposium (IRPS) - Waikoloa, HI, USA (2014.6.1-2014.6.5)] 2014 IEEE International Reliability Physics Symposium - Universality of NBTI - From devices to circuits and products

✍ Mahapatra, S.; Huard, V.; Kerber, A.; Reddy, V.; Kalpat, S.; Haggag, A. 📂 Article 📅 2014 🏛 IEEE ⚖ 931 KB