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[IEEE 2014 IEEE International Reliability Physics Symposium (IRPS) - Waikoloa, HI, USA (2014.6.1-2014.6.5)] 2014 IEEE International Reliability Physics Symposium - The physical mechanism investigation of AC TDDB behavior in advanced gate stack

✍ Scribed by Chen, C. L.; Chang, S. W.; Chen, S. C.; Lee, Y.-H.; Lee, Y. W.; Huang, D. S.; Shih, J. R.; Wu, K.

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