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[IEEE 2014 IEEE International Meeting for Future of Electron Devices, Kansai (IMFEDK) - Kyoto, Japan (2014.6.19-2014.6.20)] 2014 IEEE International Meeting for Future of Electron Devices, Kansai (IMFEDK) - Maximum and minimum voltage sample and hold circuits employing operational amplifiers composed of polycrystalline silicon thin-film transistors

✍ Scribed by Ohno, Yasuhiko; Ito, Yoshihiro; Nagase, Yosuke; Yoshikawa, Akito; Matsuda, Tokiyoshi; Kimura, Mutsumi

Book ID: 126599077
Publisher: IEEE
Year: 2014
Weight: 331 KB
Category: Article
ISBN: 1479936146
DOI: 10.1109/IMFEDK.2014.6867076

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