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[IEEE 2014 IEEE 17th International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS) - Warsaw, Poland (2014.4.23-2014.4.25)] 17th International Symposium on Design and Diagnostics of Electronic Circuits & Systems - Protecting combinational logic in pipelined microprocessor cores against transient and permanent faults

✍ Scribed by Wali, I.; Virazel, A.; Bosio, A.; Dilillo, L.; Girard, P.; Todri, A.

Book ID: 127381883
Publisher: IEEE
Year: 2014
Weight: 348 KB
Category: Article
ISBN: 1479945609
DOI: 10.1109/ddecs.2014.6868794

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