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[IEEE 2014 IEEE 17th International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS) - Warsaw, Poland (2014.4.23-2014.4.25)] 17th International Symposium on Design and Diagnostics of Electronic Circuits & Systems - Modeling timing constraints for automatic generation of embedded test instruments

✍ Scribed by Ostendorff, S.; Meza Escobar, J.-H.; Wuttke, H.-D.; Sasse, T.; Richter, S.

Book ID: 125833712
Publisher: IEEE
Year: 2014
Weight: 616 KB
Category: Article
ISBN: 1479945609
DOI: 10.1109/DDECS.2014.6868790

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