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[IEEE 2013 International Symposium on VLSI Design, Automation and Test (VLSI-DAT) - Hsinchu (2013.4.22-2013.4.24)] 2013 International Symposium onVLSI Design, Automation, and Test (VLSI-DAT) - Analysis of the leakage effect in a pipelined ADC with nanoscale CMOS technologies

✍ Scribed by Chin-Yu Lin, ; Yen-Chuan Huang, ; Tai-Cheng Lee,

Book ID: 121084189
Publisher: IEEE
Year: 2013
Weight: 745 KB
Category: Article
ISBN: 1467344354
DOI: 10.1109/VLDI-DAT.2013.6533874

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