𝔖 Bobbio Scriptorium

✦ LIBER ✦

[IEEE 2013 International Symposium on VLSI Design, Automation and Test (VLSI-DAT) - Hsinchu (2013.4.22-2013.4.24)] 2013 International Symposium onVLSI Design, Automation, and Test (VLSI-DAT) - Terahertz electronics: Opportunities, challenges and technologies

✍ Scribed by Lee, T.

Book ID: 120580552
Publisher: IEEE
Year: 2013
Weight: 495 KB
Category: Article
ISBN: 1467344354
DOI: 10.1109/VLDI-DAT.2013.6533814

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

[IEEE 2013 International Symposium on VL

[IEEE 2013 International Symposium on VLSI Design, Automation and Test (VLSI-DAT) - Hsinchu (2013.4.22-2013.4.24)] 2013 International Symposium onVLSI Design, Automation, and Test (VLSI-DAT) - Design challenges for analog & mixed signal designs

✍ Jeong-Tyng Li, 📂 Article 📅 2013 🏛 IEEE ⚖ 563 KB

[IEEE 2013 International Symposium on VL

[IEEE 2013 International Symposium on VLSI Design, Automation and Test (VLSI-DAT) - Hsinchu (2013.4.22-2013.4.24)] 2013 International Symposium onVLSI Design, Automation, and Test (VLSI-DAT) - Electromigration- and obstacle-avoiding routing tree construction

✍ Yun-Chih Tsai, ; Tai-Hung Li, ; Tai-Chen Chen, ; Chung-Wei Yeh, 📂 Article 📅 2013 🏛 IEEE ⚖ 611 KB

[IEEE 2013 International Symposium on VL

[IEEE 2013 International Symposium on VLSI Design, Automation and Test (VLSI-DAT) - Hsinchu (2013.4.22-2013.4.24)] 2013 International Symposium onVLSI Design, Automation, and Test (VLSI-DAT) - A practical NoC design for parallel DES computation

✍ Yuan, R.; Ruan, S.; Gotze, J. 📂 Article 📅 2013 🏛 IEEE ⚖ 666 KB

[IEEE 2013 International Symposium on VL

[IEEE 2013 International Symposium on VLSI Design, Automation and Test (VLSI-DAT) - Hsinchu (2013.4.22-2013.4.24)] 2013 International Symposium onVLSI Design, Automation, and Test (VLSI-DAT) - Jitter error cancellation technique in digital domain for ADC

✍ Chin-Yu Lin, ; Tai-Cheng Lee, 📂 Article 📅 2013 🏛 IEEE ⚖ 550 KB

[IEEE 2013 International Symposium on VL

[IEEE 2013 International Symposium on VLSI Design, Automation and Test (VLSI-DAT) - Hsinchu (2013.4.22-2013.4.24)] 2013 International Symposium onVLSI Design, Automation, and Test (VLSI-DAT) - CMOS reliability: From discrete device degradation to circuit aging

✍ Nigam, T. 📂 Article 📅 2013 🏛 IEEE ⚖ 498 KB

[IEEE 2013 International Symposium on VL

[IEEE 2013 International Symposium on VLSI Design, Automation and Test (VLSI-DAT) - Hsinchu (2013.4.22-2013.4.24)] 2013 International Symposium onVLSI Design, Automation, and Test (VLSI-DAT) - A successive approximation ADC with resistor-capacitor hybrid structure

✍ Ting-Zi Chen, ; Soon-Jyh Chang, ; Guan-Ying Huang, 📂 Article 📅 2013 🏛 IEEE ⚖ 895 KB